| Original language | English |
|---|---|
| Title of host publication | Proc. IEEE VAST |
| Number of pages | 12 |
| Publication status | Published - 2019 |
Fields of Expertise
- Information, Communication & Computing
FDive: Learning Relevance Models using Pattern-based Similarity Measures
F. Dennig, T. Polk, Z. Lin, T. Schreck, H.-P. Pfister, M. Behrisch
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review