FDive: Learning Relevance Models using Pattern-based Similarity Measures

F. Dennig, T. Polk, Z. Lin, T. Schreck, H.-P. Pfister, M. Behrisch

    Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

    Original languageEnglish
    Title of host publicationProc. IEEE VAST
    Number of pages12
    Publication statusPublished - 2019

    Fields of Expertise

    • Information, Communication & Computing

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