In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method

R.N. Viswanath, J. Weißmüller, Roland Würschum, H. Gleiter

    Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the Internat. Conf. on Advances in Materials and Materials Processing
    PublisherTata McGraw-Hill Publ.
    Publication statusPublished - 2002

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