Jitter: Basics, Relevance and Measurement methods

D Pommerenke

Jitter: Basics, Relevance and Measurement methods

Institute of Electronics (4390)

Research output: Contribution to conference › Abstract › peer-review

Original language	English
Pages	1521-1534
Number of pages	14
Publication status	Published - 1 Jan 2008
Event	2008 IEEE International Symposium on Electromagnetic Compatibility: EMC 2008 - Detroit, United States Duration: 18 Aug 2008 → 22 Aug 2008

Conference

Conference	2008 IEEE International Symposium on Electromagnetic Compatibility
Country/Territory	United States
City	Detroit
Period	18/08/08 → 22/08/08

Cite this

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Jitter: Basics, Relevance and Measurement methods

Conference

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