Model-Based Mutation Testing of an Industrial Measurement Device

Bernhard Aichernig; Jakob Auer; Elisabeth Jöbstl; Robert Korosec; Willibald Krenn; Rupert Schlick; Birgit Vera Schmidt

doi:10.1007/978-3-319-09099-3_1

Model-Based Mutation Testing of an Industrial Measurement Device

Bernhard Aichernig, Jakob Auer, Elisabeth Jöbstl, Robert Korosec, Willibald Krenn, Rupert Schlick, Birgit Vera Schmidt

Institute of Software Engineering and Artificial Intelligence (7160)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Tests and Proofs
Publisher	Springer
Pages	1-9
Volume	8570
DOIs	https://doi.org/10.1007/978-3-319-09099-3_1
Publication status	Published - 2014
Event	International Conference on Tests and Proofs: TAP 2014 - York, United Kingdom Duration: 24 Jul 2014 → 25 Jul 2014

Publication series

Name	Lecture Notes in Computer Science
Publisher	Springer

Conference

Conference	International Conference on Tests and Proofs
Abbreviated title	TAP 2014
Country/Territory	United Kingdom
City	York
Period	24/07/14 → 25/07/14

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Application
Experimental

Access to Document

10.1007/978-3-319-09099-3_1

TRUFAL - Trust via Failed Falsification of Complex Dependable Systems Using Automated Test-Case Generation through Model Mutation
Jöbstl, E. (Co-Investigator (CoI)) & Aichernig, B. (Principal Investigator (PI))
1/03/11 → 28/02/14
Project: Research project

Cite this

@inproceedings{a48e892bd729413db8d3995d39ace781,

title = "Model-Based Mutation Testing of an Industrial Measurement Device",

author = "Bernhard Aichernig and Jakob Auer and Elisabeth J{\"o}bstl and Robert Korosec and Willibald Krenn and Rupert Schlick and Schmidt, {Birgit Vera}",

year = "2014",

doi = "10.1007/978-3-319-09099-3_1",

language = "English",

volume = "8570",

series = "Lecture Notes in Computer Science",

publisher = "Springer",

pages = "1--9",

booktitle = "Tests and Proofs",

note = "International Conference on Tests and Proofs : TAP 2014, TAP 2014 ; Conference date: 24-07-2014 Through 25-07-2014",

}

TY - GEN

T1 - Model-Based Mutation Testing of an Industrial Measurement Device

AU - Aichernig, Bernhard

AU - Auer, Jakob

AU - Jöbstl, Elisabeth

AU - Korosec, Robert

AU - Krenn, Willibald

AU - Schlick, Rupert

AU - Schmidt, Birgit Vera

PY - 2014

Y1 - 2014

U2 - 10.1007/978-3-319-09099-3_1

DO - 10.1007/978-3-319-09099-3_1

M3 - Conference paper

VL - 8570

T3 - Lecture Notes in Computer Science

SP - 1

EP - 9

BT - Tests and Proofs

PB - Springer

T2 - International Conference on Tests and Proofs

Y2 - 24 July 2014 through 25 July 2014

ER -

Model-Based Mutation Testing of an Industrial Measurement Device

Publication series

Conference

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

Projects

TRUFAL - Trust via Failed Falsification of Complex Dependable Systems Using Automated Test-Case Generation through Model Mutation

Cite this