Model-Based Mutation Testing of an Industrial Measurement Device

Bernhard Aichernig; Jakob Auer; Elisabeth Jöbstl; Robert Korosec; Willibald Krenn; Rupert Schlick; Birgit Vera Schmidt

doi:10.1007/978-3-319-09099-3_1

Model-Based Mutation Testing of an Industrial Measurement Device

Bernhard Aichernig, Jakob Auer, Elisabeth Jöbstl, Robert Korosec, Willibald Krenn, Rupert Schlick, Birgit Vera Schmidt

Institute of Software Technology (7160)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Tests and Proofs
Publisher	Springer
Pages	1-9
Volume	8570
DOIs	https://doi.org/10.1007/978-3-319-09099-3_1
Publication status	Published - 2014
Event	International Conference on Tests and Proofs: TAP 2014 - York, United Kingdom Duration: 24 Jul 2014 → 25 Jul 2014

Publication series

Name	Lecture Notes in Computer Science
Publisher	Springer

Conference

Conference	International Conference on Tests and Proofs
Abbreviated title	TAP 2014
Country/Territory	United Kingdom
City	York
Period	24/07/14 → 25/07/14

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Application
Experimental

Access to Document

10.1007/978-3-319-09099-3_1

TRUFAL - Trust via Failed Falsification of Complex Dependable Systems Using Automated Test-Case Generation through Model Mutation
Jöbstl, E. & Aichernig, B.
1/03/11 → 30/06/14
Project: Research project

Cite this

@inproceedings{a48e892bd729413db8d3995d39ace781,

title = "Model-Based Mutation Testing of an Industrial Measurement Device",

author = "Bernhard Aichernig and Jakob Auer and Elisabeth J{\"o}bstl and Robert Korosec and Willibald Krenn and Rupert Schlick and Schmidt, {Birgit Vera}",

year = "2014",

doi = "10.1007/978-3-319-09099-3_1",

language = "English",

volume = "8570",

series = "Lecture Notes in Computer Science",

publisher = "Springer",

pages = "1--9",

booktitle = "Tests and Proofs",

note = "International Conference on Tests and Proofs : TAP 2014, TAP 2014 ; Conference date: 24-07-2014 Through 25-07-2014",

}

TY - GEN

T1 - Model-Based Mutation Testing of an Industrial Measurement Device

AU - Aichernig, Bernhard

AU - Auer, Jakob

AU - Jöbstl, Elisabeth

AU - Korosec, Robert

AU - Krenn, Willibald

AU - Schlick, Rupert

AU - Schmidt, Birgit Vera

PY - 2014

Y1 - 2014

U2 - 10.1007/978-3-319-09099-3_1

DO - 10.1007/978-3-319-09099-3_1

M3 - Conference paper

VL - 8570

T3 - Lecture Notes in Computer Science

SP - 1

EP - 9

BT - Tests and Proofs

PB - Springer

T2 - International Conference on Tests and Proofs

Y2 - 24 July 2014 through 25 July 2014

ER -

Model-Based Mutation Testing of an Industrial Measurement Device

Publication series

Conference

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

Projects

TRUFAL - Trust via Failed Falsification of Complex Dependable Systems Using Automated Test-Case Generation through Model Mutation

Cite this