Pulse Frequency Effects on Probability of ESD Soft Failures for a Specific Camera Subsystem

Yanlin Nie, Qiupei Huang, Xiang Li, Xiaofei Xie, David Johannes Pommerenke, Zhiwei Liu, Jizhi Liu

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


In this paper, the frequency of injection pulses has been varied to study its influence on soft failure probability. Injection pulses with different frequencies are injected into a camera sub-system of a smartphone prototype. It is found that the pulse frequency is nonlinear with the soft failure probability.

Original languageEnglish
Title of host publicationInternational EOS/ESD Symposium on Design and System 2020, IEDS 2020
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9781585373284
Publication statusPublished - 23 Jun 2021
Event1st Annual International EOS/ESD Symposium on Design and System: IEDS 2020 - Virtuell
Duration: 23 Jun 202025 Jun 2020


Conference1st Annual International EOS/ESD Symposium on Design and System
Abbreviated titleIEDS 2020

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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