Time domain FEM computational approach for calibration of surface scan method

The surface scan method constitutes an effective methodology to characterize printed circuit boards and integrated circuits in terms of electromagnetic emission and immunity. It is a useful technique to locate areas of critical radiation or susceptibility which could influence the performance of devices nearby or the device under test itself. The radiated near-field gathered during the test sequence is effectively influenced by the electric-and magnetic-field probes used in the course of the measurement process hence a calibration of the setup is required. This calibration is done via a 3D-FEM-wave simulation in the time domain, stimulated with a Gaussian pulse, to gather the near-field behavior over the frequency range of interest. The numerically derived results can be used during post processing to eliminate the probe's influence on the measured results.