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Abstract
This article presents a new technique for evaluating the consistency of the reference impedance in multiline thru–reflect–line (TRL) calibration. During the calibration process, it is assumed that all transmission line standards have the same characteristic impedance. However, these assumptions are prone to errors due to imperfections, which can affect the validity of the reference impedance after calibration. Our proposed method involves using multiple stepped impedance lines of different lengths to extract the broadband reflection coefficient of the impedance transition. This reflection coefficient can be used to validate the reference impedance experimentally without requiring fully defined standards. We demonstrate this method using multiline TRL based on microstrip structures on a printed circuit board (PCB) with an on-wafer probing setup
Original language | English |
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Article number | 10251578 |
Number of pages | 12 |
Journal | IEEE Open Journal of Instrumentation and Measurement |
Volume | 2 |
DOIs | |
Publication status | Published - 14 Sept 2023 |
ASJC Scopus subject areas
- Instrumentation
- Electrical and Electronic Engineering
- Signal Processing
Fields of Expertise
- Information, Communication & Computing
Treatment code (Nähere Zuordnung)
- Experimental
- Basic - Fundamental (Grundlagenforschung)
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Dive into the research topics of 'Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards'. Together they form a unique fingerprint.Projects
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CD-Laboratory for Technology guided electronic component design and characterization
Bösch, W., Hatab, Z., Gadringer, M. E., Takahashi, H., Maier, C., Sarbandi Farahani, H., Pauser, C., Paulitsch, H., Rezaee, B. & Fuchs, M.
1/11/20 → 31/10/27
Project: Research project