Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards

Ziad Hatab; Michael Ernst Gadringer; Ahmad Bader Alothman Alterkawi; Wolfgang Bösch

doi:10.1109/OJIM.2023.3315349

Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards

Ziad Hatab^*, Michael Ernst Gadringer, Ahmad Bader Alothman Alterkawi, Wolfgang Bösch

^*Corresponding author for this work

Institute of Microwave and Photonic Engineering (4510)

Research output: Contribution to journal › Article › peer-review

Abstract

This article presents a new technique for evaluating the consistency of the reference impedance in multiline thru–reflect–line (TRL) calibration. During the calibration process, it is assumed that all transmission line standards have the same characteristic impedance. However, these assumptions are prone to errors due to imperfections, which can affect the validity of the reference impedance after calibration. Our proposed method involves using multiple stepped impedance lines of different lengths to extract the broadband reflection coefficient of the impedance transition. This reflection coefficient can be used to validate the reference impedance experimentally without requiring fully defined standards. We demonstrate this method using multiline TRL based on microstrip structures on a printed circuit board (PCB) with an on-wafer probing setup

Original language	English
Article number	10251578
Number of pages	12
Journal	IEEE Open Journal of Instrumentation and Measurement
Volume	2
DOIs	https://doi.org/10.1109/OJIM.2023.3315349
Publication status	Published - 14 Sept 2023

ASJC Scopus subject areas

Instrumentation
Electrical and Electronic Engineering
Signal Processing

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Experimental
Basic - Fundamental (Grundlagenforschung)

Access to Document

10.1109/OJIM.2023.3315349Licence: CC BY 4.0

IEEE OJIM - Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance StandardsFinal published version, 7.76 MBLicence: CC BY 4.0

1 Active

CD-Laboratory for Technology guided electronic component design and characterization
Bösch, W. (Co-Investigator (CoI)), Hatab, Z. (Co-Investigator (CoI)), Gadringer, M. E. (Co-Investigator (CoI)), Takahashi, H. (Co-Investigator (CoI)), Maier, C. (Co-Investigator (CoI)), Sarbandi Farahani, H. (Co-Investigator (CoI)), Pauser-Greistorfer, C. (Co-Investigator (CoI)), Paulitsch, H. (Co-Investigator (CoI)), Rezaee, B. (Co-Investigator (CoI)) & Fuchs, M. (Co-Investigator (CoI))
1/11/20 → 31/10/27
Project: Research project

1 Poster presentation

Validation of the Reference Impedance in Multiline Calibration With Stepped Impedance Standards
Gadringer, M. E. (Speaker), Hatab, Z. (Speaker), Alothman Alterkawi, A. B. (Speaker) & Bösch, W. (Speaker)
22 May 2024
Activity: Talk or presentation › Poster presentation › Science to science

2 Preprint
1 Conference paper

A Thru-free Multiline Calibration
Hatab, Z., Gadringer, M. E. & Bösch, W., 5 May 2023.
Research output: Working paper › Preprint

File
Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration
Hatab, Z., Gadringer, M. E. & Bösch, W., 22 Jan 2023, arXiv, 9 p.
Research output: Working paper › Preprint

Open Access
File
Improving The Reliability of The Multiline TRL Calibration Algorithm
Hatab, Z., Gadringer, M. & Bösch, W., 18 Jan 2022, 98th ARFTG Microwave Measurement Conference: Non-Linear Methods and Measurements for RF and mm-Wave, ARFTG 2022. ACM/IEEE, p. 1-5 5 p. 9844064. (98th ARFTG Microwave Measurement Conference: Non-Linear Methods and Measurements for RF and mm-Wave, ARFTG 2022).
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Cite this

@article{e77c7afe11de44b6b073f27b4eec49d9,

title = "Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards",

abstract = "This article presents a new technique for evaluating the consistency of the reference impedance in multiline thru–reflect–line (TRL) calibration. During the calibration process, it is assumed that all transmission line standards have the same characteristic impedance. However, these assumptions are prone to errors due to imperfections, which can affect the validity of the reference impedance after calibration. Our proposed method involves using multiple stepped impedance lines of different lengths to extract the broadband reflection coefficient of the impedance transition. This reflection coefficient can be used to validate the reference impedance experimentally without requiring fully defined standards. We demonstrate this method using multiline TRL based on microstrip structures on a printed circuit board (PCB) with an on-wafer probing setup",

keywords = "Calibration, Impedance, Standards, Reflection coefficient, Microstrip, Substrates, Broadband communication",

author = "Ziad Hatab and Gadringer, {Michael Ernst} and Alterkawi, {Ahmad Bader Alothman} and Wolfgang B{\"o}sch",

year = "2023",

month = sep,

day = "14",

doi = "10.1109/OJIM.2023.3315349",

language = "English",

volume = "2",

journal = "IEEE Open Journal of Instrumentation and Measurement",

issn = "2768-7236",

publisher = "Institute of Electrical and Electronics Engineers",

}

TY - JOUR

T1 - Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards

AU - Hatab, Ziad

AU - Gadringer, Michael Ernst

AU - Alterkawi, Ahmad Bader Alothman

AU - Bösch, Wolfgang

PY - 2023/9/14

Y1 - 2023/9/14

N2 - This article presents a new technique for evaluating the consistency of the reference impedance in multiline thru–reflect–line (TRL) calibration. During the calibration process, it is assumed that all transmission line standards have the same characteristic impedance. However, these assumptions are prone to errors due to imperfections, which can affect the validity of the reference impedance after calibration. Our proposed method involves using multiple stepped impedance lines of different lengths to extract the broadband reflection coefficient of the impedance transition. This reflection coefficient can be used to validate the reference impedance experimentally without requiring fully defined standards. We demonstrate this method using multiline TRL based on microstrip structures on a printed circuit board (PCB) with an on-wafer probing setup

AB - This article presents a new technique for evaluating the consistency of the reference impedance in multiline thru–reflect–line (TRL) calibration. During the calibration process, it is assumed that all transmission line standards have the same characteristic impedance. However, these assumptions are prone to errors due to imperfections, which can affect the validity of the reference impedance after calibration. Our proposed method involves using multiple stepped impedance lines of different lengths to extract the broadband reflection coefficient of the impedance transition. This reflection coefficient can be used to validate the reference impedance experimentally without requiring fully defined standards. We demonstrate this method using multiline TRL based on microstrip structures on a printed circuit board (PCB) with an on-wafer probing setup

KW - Calibration

KW - Impedance

KW - Standards

KW - Reflection coefficient

KW - Microstrip

KW - Substrates

KW - Broadband communication

U2 - 10.1109/OJIM.2023.3315349

DO - 10.1109/OJIM.2023.3315349

M3 - Article

SN - 2768-7236

VL - 2

JO - IEEE Open Journal of Instrumentation and Measurement

JF - IEEE Open Journal of Instrumentation and Measurement

M1 - 10251578

ER -

Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards

Abstract

ASJC Scopus subject areas

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

Fingerprint

Projects

CD-Laboratory for Technology guided electronic component design and characterization

Activities

Validation of the Reference Impedance in Multiline Calibration With Stepped Impedance Standards

Research output

A Thru-free Multiline Calibration

Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration

Improving The Reliability of The Multiline TRL Calibration Algorithm

Cite this