High energy resolution EELS using a monochromized 200 kV TEM: Comparative investigation of titanium oxides

Christoph Mitterbauer, Gerald Kothleitner, Ferdinand Hofer, Peter Tiemeijer, Bert Freitag, Henny W. Zandenbergen

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	86-87
Journal	Microscopy and Microanalysis
Volume	9
Issue number	Suppl. 3
Publication status	Published - 2003

Treatment code (Nähere Zuordnung)

Near-Edge Fine Structures in EELS
Kothleitner, G., Grogger, W., Hofer, F., Wewerka, K., Letofsky-Papst, I. & Mitterbauer, C.
1/02/00 → 31/12/05
Project: Research area
Analytical Electron Microscopy
Schaffer, B., Hofer, F., Rogers, M., Mitterbauer, C. & Wewerka, K.
1/01/95 → 31/01/03
Project: Research area

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title = "High energy resolution EELS using a monochromized 200 kV TEM: Comparative investigation of titanium oxides",

author = "Christoph Mitterbauer and Gerald Kothleitner and Ferdinand Hofer and Peter Tiemeijer and Bert Freitag and Zandenbergen, {Henny W.}",

year = "2003",

language = "English",

volume = "9",

pages = "86--87",

journal = "Microscopy and Microanalysis",

issn = "1435-8115",

publisher = "Cambridge University Press",

number = "Suppl. 3",

}

TY - JOUR

T1 - High energy resolution EELS using a monochromized 200 kV TEM: Comparative investigation of titanium oxides

AU - Mitterbauer, Christoph

AU - Kothleitner, Gerald

AU - Hofer, Ferdinand

AU - Tiemeijer, Peter

AU - Freitag, Bert

AU - Zandenbergen, Henny W.

PY - 2003

Y1 - 2003

M3 - Article

SN - 1435-8115

VL - 9

SP - 86

EP - 87

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Suppl. 3

ER -